W. Hwang, R.V. Joshi, et al.
ICCD 1997
The dc I-V characteristics of superconducting thin-film Sn-Au proximity bridges and uniform-thickness Sn microbridges have been carefully analyzed as a function of the directly measured current-phase relation (CPR). At sufficiently low dc current and voltage levels where heating and relaxation time effects are not important, the I-V characteristics are very well described by a shunted weak-link model that includes the proper dc CPR and a shunt resistance.
W. Hwang, R.V. Joshi, et al.
ICCD 1997
W.H. Henkels, C.J. Kircher
IEEE Transactions on Magnetics
W.H. Henkels
Journal of Applied Physics
R. Viswanathan, David Seeger, et al.
Microelectronic Engineering