Narendra Parihar, Richard G. Southwick, et al.
IEEE T-ED
In spite of 50 years of history, there is still no consensus on the basic physics of Negative Bias Temperature Instability. Two competing models, Reaction-Diffusion and Defect-Centric, currently vie for dominance. The differences appear fundamental: one model holds that NBTI is a diffusion-limited process and the other holds that it is reaction-limited. Basic issues of disagreement are summarized and the main controversial aspects of each model are reviewed and contrasted.
Narendra Parihar, Richard G. Southwick, et al.
IEEE T-ED
Miaomiao Wang, Sufi Zafar, et al.
Microelectronic Engineering
Narendra Parihar, Richard G. Southwick, et al.
IRPS 2017
Nilotpal Choudhury, Tarun Samadder, et al.
IRPS 2021