P. Alnot, D.J. Auerbach, et al.
Surface Science
In this paper we describe a novel method of eliminating charging during the high resolution SEM inspection and dimensional measurements of x-ray and optical masks. A soluble conducting polymer, polyaniline, is spin-coated on the mask and found to prevent charging even at 15 KV. This method is a non-destructive process in contrast to the commonly used technique of metal deposition, since the polymer can be cleanly removed without any damage to the mask. © 1991.
P. Alnot, D.J. Auerbach, et al.
Surface Science
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
A. Krol, C.J. Sher, et al.
Surface Science