PaperThe structure of electroplated and vapor-deposited copper filmsA. GanguleeJournal of Applied Physics
PaperEffect of alloy additions on electromigration failures in thin aluminum filmsA. Gangulee, F.M. D'HeurleApplied Physics Letters
PaperElectromigration and transport reversal in copper-silver thin filmsA. Gangulee, F.M. d'HeurleJournal of Physics and Chemistry of Solids