B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
ESD robustness of 4 kV HBM is achieved in CMOS-on-SOI ESD protection networks in an advanced sub-0.25 μm mainstream CMOS-on-SOI technology. Design layout, body contact, floating-gate effects and novel ESD protection implementations are discussed. © 1998 Elsevier Science B.V.
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
Revanth Kodoru, Atanu Saha, et al.
arXiv
Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT