Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
We report high-speed planar silicon p-i-n photodiodes fabricated on Silicon-on-Insulator (SOI) substrates. The devices were fabricated in standard CMOS technology with no additional fabrication steps required. The 250-nm finger-spacing devices exhibited 15- and 8-GHz bandwidths for devices processed on 200- and 2000-nm SOI substrates, respectively, at a reverse bias of -9 V. Quantum efficiencies of 12% and 2% were measured on the 2- and 0.2-μm thick SOI, respectively. The dark current was 5 pA for -3 V bias and 500 μA for -9 V bias.
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures