Chemical characterization of surfaces and interfaces of industrial materials by X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary ion mass spectrometry

Surendra B. Anantharaman, Joachim Kohlbrecher, et al.

MRS Fall Meeting 2020

I. Morgenstern, K.A. Müller, et al.

Physica B: Physics of Condensed Matter

A.B. McLean, R.H. Williams

Journal of Physics C: Solid State Physics

Xikun Hu, Wenlin Liu, et al.

IEEE J-STARS