Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Paper

01 Jan 1991

Characterization of epitaxial thin films by x-ray diffraction

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Abstract

No abstract available.

Paper

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Physical Review B

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Small

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Ligand-stabilized copper(I) hexafluoroacetylacetonate complexes: NMR spectroscope and the nature of the copper-alkene bond

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Journal of Organometallic Chemistry

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Silylation of resist materials using di- and polyfunctional organosilicon compounds

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Microelectronic Engineering

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