R.F. Broom, W. Jutzi, et al.
IEEE Transactions on Magnetics
Characteristics of in-line Josephson gates have been computed, using numerical techniques, for a number of differing junction length to Josephson penetration depth ratios. These are verified by systematic experimental results, where the agreement between theory and experiment was found to be good. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.
R.F. Broom, W. Jutzi, et al.
IEEE Transactions on Magnetics
R.F. Broom, P. Gueret, et al.
ISSCC 1978
S. Strite, P.W. Epperlein, et al.
MRS Fall Meeting 1995
H.P. Meier, R.F. Broom, et al.
Journal of Crystal Growth