I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
We show that from measurements of the reflectivity of a uniaxial medium taken at a finite incidence angle with s- and p-polarized light it is possible to determine the dielectric function both parallel and perpendicular to the optical axis. When applied to layered compounds with its surface parallel to the layers, this technique allows for an accurate determination of the loss function perpendicular to the layers. This is demonstrated for the example of c-axis oriented thin films of the high-Tc superconductor Tl2Ba2Ca2Cu3O10, on which we carried out polarized reflectivity measurements at 45°incidence angle above and below Tc. © 1994 The American Physical Society.
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
K.A. Chao
Physical Review B
Michiel Sprik
Journal of Physics Condensed Matter
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering