Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
An analytical technique called thermal diagnostics is presented as a tool for determining the root cause of thermal anomalies arising in electronic equipment. The technique utilizes a dynamically constructed flow network model, real-time inventory, temperature, utilization metrics, and statistical hypothesis testing to select the most likely scenario from among thousands of potential causes of thermal problems. This paper describes the concept of thermal diagnostics and concludes with results from a laboratory evaluation in which we physically trigger thermal anomalies on a running IBM eServer™ BladeCenter® system and record the diagnosis given by the algorithm. In these tests, our algorithm correctly diagnosed the thermal situation and provided meaningful guidance toward clearing the detected problems. ©Copyright 2005 by International Business Machines Corporation.
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
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SPIE Advanced Lithography 2010
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EDOC 2004
Robert G. Farrell, Catalina M. Danis, et al.
RecSys 2012