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Microelectronic Engineering
An electron microscope structure image of a Σ = 21/[111] tilt grain boundary in Au was obtained and atomic column positions identified to yield a structural unit model of the interface consisting of repeating polyhedron shapes. This result represents the smallest projected spacings at a grain boundary containing defect structures imaged by an electron microscope and interpreted atomistically. © 1990, Materials Research Society. All rights reserved.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
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