J. Tersoff
Applied Surface Science
We report the first voltage-dependent scanning tunneling microscope images of a compound semiconductor surface, GaAs(110). Images show either only Ga atoms, or only As atoms, depending on the bias voltage. By combining voltage-dependent images with theoretical calculations, we quantitatively determine surface structural parameters which cannot be inferred from the images alone. © 1987 The American Physical Society.
J. Tersoff
Applied Surface Science
R.M. Feenstra, Joseph A. Stroscio
Physical Review Letters
J.J. Zhang, A. Rastelli, et al.
Applied Physics Letters
J. Tersoff
Physical Review B