C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
We have observed an anomalous coverage dependence of sputtered Cs+ and Li+ yields from Cs and Li overlayers on Si(111) surfaces. The ion yield reaches a maximum and decreases at higher coverages even when the coverage is still less than a monolayer. We found that this phenomenon is directly related to the effect of the work function on the ionization probability. © 1984 The American Physical Society.
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
T. Schneider, E. Stoll
Physical Review B
Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry
A. Reisman, M. Berkenblit, et al.
JES