Fan Jing Meng, Ying Huang, et al.
ICEBE 2007
In this paper, we review the current status of single-event upsets caused by alpha-particles in IBM circuits and technology. While both alpha-particles and cosmic radiation can induce upsets, the alpha-particle-induced upset rate has become an increasingly important issue because alpha-particle- induced upsets are no longer limited to memory circuits. Latch circuits have become highly sensitive to alpha-particles. The alpha-particle-induced upset rate of latch circuits is one of the most critical issues for microprocessors requiring both high performance and high reliability. © Copyright 2008 by International Business Machines Corporation.
Fan Jing Meng, Ying Huang, et al.
ICEBE 2007
Oliver Bodemer
IBM J. Res. Dev
Elena Cabrio, Philipp Cimiano, et al.
CLEF 2013
J.P. Locquet, J. Perret, et al.
SPIE Optical Science, Engineering, and Instrumentation 1998