Conference paper
Hardness assurance testing for proton direct ionization effects
James R. Schwank, Marty R. Shaneyfelt, et al.
RADECS 2011
The emitted alpha particle energy distribution from solder bumps can show substantial surface emission which has a large impact on the modeled SEU rate. State-of-the art alpha-particle detectors are required to measure the low emissivity and energy distribution. © 2010 IEEE.
James R. Schwank, Marty R. Shaneyfelt, et al.
RADECS 2011
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Semiconductor Science and Technology
Jonathan A. Pellish, Michael A. Xapsos, et al.
IEEE TNS
Michael S. Gordon, Kenneth P. Rodbell, et al.
IEEE TNS