Robert Bertin, Alina Deutsch
IEEE Transactions on Components, Hybrids, and Manufacturing Technology
An electrical probe based on specially designed coaxial tips is shown to have 24-GHz bandwidth. It can be used to test high-speed signal propagation on planar or nonplanar chip or package interconnection structures with signal/ground pads as small as 50 µm. The detailed fabrication procedure, characterization, and use of the probe are presented. A variation of the design has 500-Ω input impedance and a bandwidth of 19 GHz. © 1990 IEEE
Robert Bertin, Alina Deutsch
IEEE Transactions on Components, Hybrids, and Manufacturing Technology
Gerard V. Kopcsay, Byron Krauter, et al.
IEEE Transactions on VLSI Systems
G. Arjavalingam, Yvon Pastol, et al.
IEEE T-MTT
Zhen Zhou, Alina Deutsch, et al.
EPEPS 2008