E. Stoll, T. Schneider
Solid State Communications
We sketch the evidence for anisotropic 3D-XY critical behavior in La2-xSrxCuO4 thin films and explore the implications of this scenario, supplemented by the experimental phase transition line.
E. Stoll, T. Schneider
Solid State Communications
J.W. Seo, J. Fompeyrine, et al.
Applied Physics Letters
T. Schneider
Physica
O.F. De Alcantara Bonfim, T. Schneider
Physical Review B