J. Warnock, L. Sigal, et al.
ICCD 1997
An ECL circuit with a charge-buffered active-pull-down emitter-follower stage is described. Implemented in a 0-8 /an double-poly trench-isolated selfaligned bipolar process, unloaded gate delays of 14.9ps/2.2mW, 20.7ps/1.2mW, and 24.5ps/0.77mW have been achieved. © 1992, The Institution of Electrical Engineers. All rights reserved.
J. Warnock, L. Sigal, et al.
ICCD 1997
R. Rodríguez, J.H. Stathis, et al.
Microelectronics Reliability
J. Warnock, H. Abad, et al.
Physical Review B
R.V. Joshi, S.S. Kang, et al.
VLSID 2005