James H. (Jim) Stathis  James H. (Jim) Stathis photo       

contact information

Science and Technology Operations and Strategy
Thomas J. Watson Research Center, Yorktown Heights, NY USA
  +1dash914dash945dash2559

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Professional Associations

Professional Associations:  American Physical Society (APS)  |  IEEE Electron Devices Society (EDS)


Jim Stathis received the bachelor's in physics from Washington University in St. Louis (1980), and the Ph.D. in physics from the Massachusetts Institute of Technology (1986), joining the IBM Research Division the same year. At IBM the focus of his work has been fundamental and practical studies of transistor reliability, including the electrical properties of point defects in SiO2, and the role of defects in wearout and breakdown. He is the author or coauthor of more than 150 research papers and over 70 invited talks and tutorials. From November 2005 to February 2007 he served as Technical Assistant to the Vice President for Science and Technology, IBM Research Division. In February 2007 he became manager of High-k/Metal-Gate Characterization and Reliability, IBM Research. In November 2017 he became head of operations and strategy for science and technology, reporting to the Vice President of Science and Government Programs, IBM Research. Jim has served on technical program committees for IEDM, SISC, INFOS, IRPS, ESREF, IPFA, MIEL and other conferences, and as an an Associate Editor of the journal Microelectronics Reliability. He was the Technical Program Chair for IRPS 2009 and General Chair for IRPS 2011. He has presented tutorials on CMOS reliability at IRPS, ESREF, MRS, and IPFA. He is a Fellow of the American Physical Society and an IEEE Fellow.

 


(short version, limited to 100 words:)
Jim Stathis has a Ph.D. in Physics from the Massachusetts Institute of Technology. He is currently head of operations and strategy for science and technology at the IBM T. J. Watson Research Center. He is the author or coauthor of more than 150 research papers and over 80 invited talks on defects, wearout and breakdown. He was the Technical Program Chair for IRPS 2009 and General Chair for IRPS 2011. He was an Associate Editor of the journal Microelectronics Reliability from 2005-2017, and is a Fellow of the American Physical Society and an IEEE Fellow.