Peilin Song  Peilin Song photo       

contact information

Principal RSM & Manager, Circuit Test and Diagnostics Technologies
Thomas J. Watson Research Center, Yorktown Heights, NY USA
  +1dash914dash945dash3990

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Professional Associations

Professional Associations:  IEEE Circuits and System Society  |  IEEE Computer Society


2013

32nm CMOS SOI Test Site for Emission Tool Evaluation
Alan J. Weger, Franco Stellari, Seongwon Kim, Herschel A. Ainspan, Young Kwark, Christian W. Bak, Dzmitry Maliuk and Peilin Song
To be presented at International Symposium for Testing and Failure Analysis (ISTFA), 2013

1Mb 0.41 um2 2T-2R Cell Nonvolatile TCAM with Two-Bit Encoding and Clocked Self-Referenced Sensing
J. Li, R. Montoye, M. Ishii, K. Stawiasz, T. Nishida, K. Maloney, G. Ditlow, S. Lewis, T. Maffitt, R. Jordan, L. Chang and P. Song
2013 Symposia on VLSI Circuits and Technology, pp. Paper 9-1
Abstract

Tester-based methods to enhance spatial resolvability and interpretation of time-integrated and time-resolved emission measurements
Franco Stellari, Peilin Song, Alan J. Weger, Dzmitry Maliuk, Herschel A. Ainspan, Seongwon Kim, Young Kwark, and Christian W. Baks
To be presented at International Symposium for Testing and Failure Analysis (ISTFA), 2013

A Superconducting Nanowire Single-Photon Detector (SnSPD) System for Ultra Low Voltage Time-Resolved Emission (TRE) Measurements of VLSI Circuits
Franco Stellari, Alan J. Weger, Seongwon Kim, Dzmitry Maliuk, Peilin Song, Herschel A. Ainspan, Young Kwark, Christian W. Baks, and Ulrike Kindereit
To be presented at International Symposium for Testing and Failure Analysis (ISTFA), 2013

Automatic Registering and Stitching of TEM Image Mosaics
Chung-Ching Lin, Franco Stellari, Lynne Gignac, Peilin Song
To be presented at International Symposium for Testing and Failure Analysis (ISTFA), 2013


2012

Can EDA combat the rise of electronic counterfeiting?
Farinaz Koushanfar, Saverio Fazzari, Carl McCants, William Bryson, Matthew Sale, Peilin Song, Miodrag Potkonjak
Proceedings of the 49th Annual Design Automation Conference (DAC), pp. 133-138, 2012

Near-infrared Photon Emission Spectroscopy of a 45 nm SOI Ring Oscillator
U. Kidereit, A.J. Weger, F. Stellari, P. Song, H. Deslandes, T. Lundquist, and P. Sabbineni
Proc. of International Symposium on Physics and Reliability (IRPS), pp. 2D.2.1 - 2D.2.7 , 2012

Tester-Based Optical and Electrical Diagnostic System and Techniques
P. Song and F. Stellari
Proc. of IEEE VLSI Test Symposium (VTS), pp. 209-214, 2012

Root cause identification of an hard-to-find on-chip power supply coupling fail
F. Stellari, T. Cowell, P. Song, M. Sorna, Z. Toprak-Deniz, J.F. Bulzacchelli, and N.A. Mitra
Proc. of IEEE International Test Conference (ITC), pp. 11.1- 11.7, 2012

A Novel Integrated Reliability Test System for BEOL TDDB Study
J. Chen, P. Song, T. Shaw, F. Stellari, L. Gignac, C. Breslin, D. Pfeiffer, and G. Bonila
Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 297-304, 2012

Comparison of Near-Infrared Photon Emission Spectroscopy of a 45 nm and 32 nm SOI Ring Oscillators
U. Kidereit, A.J. Weger, F. Stellari, P. Song, H. Deslandes, T. Lundquist, and P. Sabbineni
Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 128-133, 2012

Advanced methods and software for enhancing analytical tools capabilities during chip diagnostic and characterization
F. Stellari and P. Song
Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 273-280, 2012


2011

Single-photon detectors for ultra-low-voltage time-resolved emission measurements of VLSI circuits
F. Stellari, P. Song, and A.J. Weger
SPIE Defense, Security & Sensing - Advanced Photon Counting Techniques V, pp. , 2011

Single Photon Detectors for Ultra Low Voltage Time Resolved Emission Measurements
F. Stellari, P. Song, and A.J. Weger
IEEE J. on Quantum Electronics 47(6), 841-848, 2011

MARVEL - Malicious Alteration Recognition and Verification by Emission of Light
P. Song, F. Stellari, D. Pfeiffer, J. Culp, A. Weger, A. Bonnoit, B. Wisnieff, T. Taubenblatt
IEEE Int. Symp. on Hardware-Oriented Security and Trust (HOST), pp. 117-121, 2011

A Position Sensitive Single Photon Detector with Enhanced NIR Response
F. Stellari, P. Song, A.J. Weger, T. Nakamura, S. Kim, and R. Roche,
Proc. of International Symposium for Testing and Failure Analysis (ISTFA), 2011


2010

Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor
M. Meterelliyoz, P. Song, F. Stellari, J.P. Kulkarni, and K. Roy
IEEE Trans. on Circuits and Systems I 57(8), 1838-1847, 2010

Electrical characterization of 3D through-silicon-vias
Fei Liu, Xiaoxiong Gu, Keith A Jenkins, Eduard A Cartier, Yong Liu, Peilin Song, Steve J Koester
IEEE Electronic Components and Technology Conference (ECTC), pp. 1100-1105, 2010


2009

Angular spectrum tailoring in solid immersion microscopy
SB Ippolito, P Song, DL Miles, JD Sylvestri
SPIE OPTO: Integrated Optoelectronic Devices, pp. 722708-722708-8, 2009

Mapping Systematic and Random Process Variations using Light Emission from Off-State Leakage
F. Stellari, P. Song, A.J. Weger, and D.L. Miles
Proc. of International Symposium on Physics and Reliability (IRPS), pp. 640-649, 2009

On-Chip Power Supply Noise Measurement using Time Resolved Emission (TRE) Waveforms of Light Emission from Off-State Leakage Current (LEOSLC)
F. Stellari, P. Song, J. Sylvestri, D. Miles, O. Forlenza, and D. Forlenza
Proc. of International Test Conference (ITC), pp. 8.1-8.10, 2009


2008

Angular spectrum tailoring in solid immersion microscopy for circuit analysis
Stephen Bradley Ippolito, P Song, DL Miles, John D Sylvestri
Applied Physics Letters92, 101109-101109-2, 2008

A packaging solution for optically testing wire-bonded chips , IEEE Trans. on Advanced Packaging
A. Tosi, F. Stellari, F. Zappa, and P. Song
IEEE Trans. on Advanced Packaging 31(3), 490-495, 2008

A High Sensitivity Process Variation Sensor Utilizing Sub-threshold Operation
M. Meterelliyoz, P. Song, F. Stellari, J.P. Kulkarni, and K. Roy
Proc. Custom Integrated Circuits Conference (CICC), pp. 125-128 , 2008

Optical Diagnostics for IBM POWER6TM Microprocessor
P. Song, S. Ippolito, F. Stellari, J. Sylvestri, T. Diemoz, G. Smith, P. Muench, N. James, S. Kim, and H. Saenz
Proc. of International Test Conference (ITC), pp. Paper 17.3, 2008

Evaluating PICA capability for future low voltage SOI chips
F. Stellari, P. Song, J. Vickers, C. Shaw, S. Kasapi, and R. Ispasoiu
Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 407-416, 2008


2006

On-chip real-time power supply noise detector
Anuja Sehgal, Peilin Song, Keith A Jenkins
Solid-State Circuits Conference, 2006. ESSCIRC 2006. Proceedings of the 32nd European, pp. 380-383

Switching Time Extraction of CMOS Gates using Time-Resolved Emission (TRE)
F. Stellari, A. Tosi, and P. Song
Proc. of International Symposium on Physics and Reliability (IRPS), pp. 566-573, 2006

High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images
F. Stellari, P. Song, T.E. Diemoz, A.J. Weger, T. Vogel, S.C. Wilson, J. Pennings, and R.F. Rizzolo
Proc. of International Test Conference, (ITC), pp. 1-10, 2006


2005

Characterization of a 0.13 um CMOS Link Chip using Time Resolved Emission (TRE)
Franco Stellari, Peilin Song, John Hryckowian, Otto A. Torreiter, Steve Wilson, Phil Wu, Alberto Tosi
Microelectronics Reliability45, 1550-1553, 2005

Testing of Ultra Low Voltage CMOS Microprocessors using the Superconducting Single-Photon Detector (SSPD)
F. Stellari and P. Song
Proc. of International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp. 2, 2005

Characterization of a 0.13 um CMOS Link Chip using Time Resolved Emission (TRE)
F. Stellari, P. Song, J. Hryckowian, O.A. Torreiter, S. Wilson, P. Wu, and A. Tosi
Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), pp. 1550-1553, 2005

CMOS IC diagnostics using the light emission from off-state leakage currents
P. Song, S. Polonsky, F. Stellari, K. Jenkins, A.J. Weger, T. Xia, and S. Cho
Electronic Device Failure Analysis 7(3), 14-20, 2005

Characterizing the VCO jitter due to the digital simultaneous switching noise
T Xia, P Song, H Zheng
Proceedings of the 15th ACM Great Lakes symposium on VLSI, pp. 70-73, 2005

Local Probing of Switching Noise in VLSI Chips using Time Resolved Emission (TRE)
F. Stellari, P. Song, and W.D. Becker
Proc. of IEEE North Atlantic Test Workshop (NATW), pp. 130-137, 2005

Advanced Optical Testing of an Array in 65 nm CMOS Technology
F. Stellari, P. Song, and T.A. Christensen
Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 355-362, 2005

An Advanced Optical Diagnostic Technique for IBM Microprocessor
P. Song, F. Stellari, B. Huott, O. Wagner, U. Srinivasan, Y. Chan, R. Rizzolo, H.J. Nam, J. Eckhardt, T. McNamara, C-L Tong, S. Wilson, A.J. Weger, and M.K. McManus
Proc. of International Test Conference, (ITC), pp. 48.1-48.9, 2005

Photon emission microscopy of inter/intra chip device performance variations
S Polonsky, M Bhushan, A Gattiker, A Weger, P Song
Microelectronics Reliability, 45(9), 1471-1475, Elsevier, 2005


2004

Dynamic latchup study using transmission line pulses and picosecond imaging circuit analysis [CMOS IC latchup]
Stellari, F. ; IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA ; Weger, A.J. ; Song, P. ; McManus, M.K.
Solid-State Device Research conference, 2004. ESSDERC 2004. Proceeding of the 34th European , pp. 205-208

Model-Based Guidelines to Suppress Cable Discharge Event (CDE)-Induced Latchup in CMOS ICs
32. K.V. Chatty, P. Cottrell, R. Gauthier, M. Muhammad, F. Stellari, P. Song, and M.K. McManus
Proc. of International Symposium on Physics and Reliability (IRPS), pp. 130-134, 2004

High Voltage/Run-In Fails: A Diagnostic Detective Story
R. Rizzolo, T. Burdine, P. Song, F. Stellari, and H-J Nam
Proc. of IEEE North Atlantic Test Workshop (NATW), pp. 165-172, 2004

Testing of a Low Voltage 0.13 um CMOS Technology Microprocessor using a High Sensitivity Superconducting Single-Photon Detector
F. Stellari and P. Song
Proc. of IEEE North Atlantic Test Workshop (NATW), pp. 151-156, 2004

Testing of ultra low voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD)
F. Stellari and P. Song
Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), pp. 1663-1668 , 2004

A BIST-based Broken Scan Chain Diagnostics
P. Song, W. Hurley, O. Forlenza, F. Motika
Informal Digest of 9th IEEE European Test Symposium, pp. 26-32, 2004

Delay Chain Based Programmable Jitter Generator
T, Xia, P. Song, K. Jenkins, J.C. Lo
Proc. of 9th IEEE European Test Symposium, pp. 16-21, 2004

A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current
P. Song, F. Stellari, T. Xia, and A.J. Weger
Proc. of International Test Conference, (ITC), pp. 140-147, 2004

Broken Scan Chain Diagnostics based on Time-Integrated and Time-Dependent Emission Measurements
F. Stellari, P. Song, T. Xia, and A.J. Weger
Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 52-57, 2004

Timing Analysis of a Microprocessor PLL using High Quantum Efficiency Superconducting Single Photon Detector (SSPD)
P. Song, F. Stellari, J.P. Eckhardt, T. McNamara, and C-L Tong
Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 197-202, 2004

Analysis of factors impacting latchup in I/O interface circuits using a combined optical and electrical testing method
F. Stellari, P. Song, M.K. McManus, R. Gauthier, A.J. Weger, K.V. Chatty, M. Muhammad, and P. Sanda
Electronic Device Failure Analysis (EDFA), 20-29, 2004

Electrical and optical characterization of latchup
F. Stellari, P. Song, A. Weger, M.K. McManus, R. Gauthier, and P. Sanda
Microelectronic Failure Analysis Desk Reference (MFADR), 174-192, 2004

Testing and diagnostics of CMOS circuits using Light Emission from Off-State Leakage Current
F. Stellari, P. Song, J.C. Tsang, M.K. McManus, and M.B. Ketchen
IEEE Trans. on Electron Devices 51(9), 1455-1462 , 2004


2003

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling
R. Desplats, A. Eral, F. Beaudoin, P. Perdu, A. Weger, M. McManus, P. Song, F. Stellari
Microelectronics Reliability43, 1663-1668, 2003

Latchup Analysis Using Emission Microscopy
Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson
Microelectronics Reliability43, 1603-1608, 2003

Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup
A.J. Weger, S. Voldman, F. Stellari, P. Song, P. Sanda, and M.K. McManus
Proc. of International Symposium on Physics and Reliability (IRPS), pp. 99-104, 2003

Optical and Electrical Testing of Latchup in I/O Interface Circuits
F. Stellari, P. Song, M.K. McManus, R. Gauthier, A.J. Weger, K. Chatty, M. Muhammad, and P. Sanda
Proc. of International Test Conference, (ITC), pp. 236-245, 2003

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling
R. Desplats, A. Eral, F. Beaudoin, P. Perdu, A.J. Weger, M.K. McManus, P. Song, and F. Stellari
Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), pp. 1663-1668, 2003

Latchup Analysis Using Emission Microscopy
F. Stellari, P. Song, M.K. McManus, A.J. Weger, R. Gauthier, K.V. Chatty, M. Muhammad, P. Sanda, P. Wu and S. Wilson
Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), pp. 1603-1608, 2003

Study of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy
F. Stellari, P. Song, M.K. McManus, A.J. Weger, R.J. Gauthier, K.V. Chatty, M. Muhammad, and P. Sanda
Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 19-24, 2003

Time-Resolved Optical Measurements from 0.13 um CMOS Technology Microprocessor using a Superconducting Single-Photon Detector
F. Stellari, P. Song, A.J. Weger, and M.K. McManus
Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 40-44, 2003

Testing of Low Power CMOS Circuits using Optical Emission from Leakage Current
P. Song, F. Stellari, J.C. Tsang, M.K. McManus, and M.B. Ketchen
Proc. of International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2003

Time-Resolved Emission Testing Challenges for Low Voltage CMOS Technologies
P. Song, F. Stellari, and M.K. McManus
Proc. of Laser and Electro-Optics Society (LEOS), pp. 596-597, 2003


2002

Blue Gene/L, a system-on-a-chip
George Almasi, et. al.
Proceedings. of 2002 IEEE International Conference on Cluster Computing, , pp. 349 - 350

Circuit Voltage Probe Based on Static Optical Emission Measurements
F. Stellari, P. Song, J.C. Tsang, M.K. McManus and M.B. Ketchen
Microelectronic Reliability42, 1689-1694, 2002

Timing Characterization Multiple Time Domains
Al Weger, M. McManus, P. Song, A. Muszuynski
Proc of 28th IEEE International Symposium for Testing and Failure Analysis (ISTFA), pp. 663-666, 2002

Optical diagnosis of excess IDDQ in low power CMOS circuits
F. Stellari, P. Song, J.C. Tsang, M.K. McManus, and M.B. Ketchen
Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), pp. 1689-1694 , 2002

Circuit voltage probe based on time-integrated measurements of optical emission from leakage current
F. Stellari, P. Song, J.C. Tsang, M.K. McManus, and M.B. Ketchen
Proc. of International Symposium for Testing and Failure Analysis (ISTFA), pp. 667-672, 2002

Picosecond Imaging Circuit Analysis of ULSI Microprocessor
M. McManus, P. Song
IEEE Microwave Symposium, pp. 1505-1508, 2002

Diagnosis of faulty I/O circuit using PICA
P. Song, M. McManus, F. Motika, D. Knebel
Electronic Device Failure Analysis (EDFA) 4(1), 12-16, 2002

Cellular supercomputing with system-on-a-chip
G Almasi et. al.
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International, pp. 196-197

An overview of the BlueGene/L supercomputer
N.Adiga et. al.
Supercomputing, ACM/IEEE 2002 Conference, pp. 60


2001

Short or Open - A Diagnostics Story
45. P. Song, F. Motika, J. Lee
Proc. of 10th IEEE North Atlantic Test Workshop, pp. 62-66, 2001


2000

A New Scan Structure for Improving Scan Chain Diagnosis and Delay Fault Coverage
P. Song
Proc. of 9th IEEE North Atlantic Test Workshop, pp. 14-18, 2000


1999

High Resolution Diagnostic Techniques for the IBM S/390 Microprocessor
P. Song, F. Motika, M. Kusko, R. Rizzolo, J. Lee, R. Clairmont
Proc. of 8th IEEE North Atlantic Test Workshop, pp. 67-75, 1999

Diagnostic Techniques for the IBM S/390 600-MHz G5 Microprocessor
P. Song, F. Motika, D. Knebel, R. Rizzolo, M. Kusko
Proc. of IEEE International Test Conference, pp. 1073-1082, 1999

S/390 G5 CMOS Microprocessor Diagnostics
P. Song, F. Motika, D. Knebel, R. Rizzolo, M. Kusko
Journal of Research and Development 43(5/6), 899-914, 1999


1998

Diagnosis of AC Faults in IBM S/390 CPU Chip
P. Song, F. Motika, J. Lee
Proc of 7th IEEE Atlantic Test Workshop, pp. 73-76, 1998

Diagnosis and Characterization of Timing-Related Defects by Time-Dependent Light Emission
D. Knebel, P. Sanda, M. McManus, J. Kash, J. Tsang, D. Vallett, L. Huisman, P. Nigh, R. Rizzolo, P. Song, F. Motika
Proc. of IEEE International Test Conference, pp. 733-739, 1998

Microprocessor Test and Test Tool Methodology for the 500MHz IBM S/390 G5 Chip
M. Kusko, B. Robbins, T. Snethen, P. Song, T. Foote, W. Huott
Proc. of IEEE International Test Conference, pp. 717-726, 1998


1997

Realistic Fault Simulations or a Standard Cell Library
P. Song, J. C. Lo
Proc. of 6th IEEE Atlantic Test Workshop, pp. 1-6, 1997


1996

Test Generation for Stuck-open faults in CMOS Combinational VLSI Circuits
P. Song, J. C. Lo
Proc. of 5th IEEE Atlantic Test Workshop, 1996

Testing the Realistic Bridging Faults in CMOS Circuits
P. Song, J. C. Lo
Proc. of IEEE International Workshop on IDDQ Testing, pp. 84-88, 1996

Testing the Realistic Defects in CMOS Combinational VLSI Circuits
P. Song, J. C. Lo
Proc. of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 114-122, 1996


1995

Test Generation Based on Testing Problems
J. Hammen, P. Song, J. C. Lo
Proc. of 4th IEEE Atlantic Test Workshop, pp. , 1995