Joel Nider  Joel Nider photo       

contact information

Systems Research - Heterogeneous Architecture
Haifa Research Lab, Haifa, Israel
  +972dash4dash829dash6326

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Professional Associations

Professional Associations:  ACM  |  ACM SIGOPS


2017

User Space Memory Management for Post-copy Migration
Mike Rapoport, Joel Nider
Proceedings of the 10th ACM International Systems and Storage Conference, pp. 21:1--21:1, ACM, 2017

Zero-copy Receive Path in Virtio
Kalman Meth, Mike Rapoport, Joel Nider, Razya Ladelsky
Proceedings of the 10th ACM International Systems and Storage Conference, pp. 19:1--19:1, ACM, 2017

Remote Page Faults with a CAPI Based FPGA
Joel Nider, Yiftach Binyamini, Mike Rapoport
Proceedings of the 10th ACM International Systems and Storage Conference, pp. 20:1--20:1, ACM, 2017


2016

Paravirtual Remote I/O
Kuperman, Yossi and Moscovici, Eyal and Nider, Joel and Ladelsky, Razya and Gordon, Abel and Tsafrir, Dan
Proceedings of the Twenty-First International Conference on Architectural Support for Programming Languages and Operating Systems, pp. 49--65, 2016

Using Storage Class Memory Efficiently for an In-memory Database
Gottesman, Yonatan and Nider, Joel and Kat, Ronen and Weinsberg, Yaron and Factor, Michael
Proceedings of the 9th ACM International on Systems and Storage Conference, pp. 21, 2016

IO Core Manager for Virtual Environments
Moscovici, Eyal and Tsafrir, Dan and Kuperman, Yossi and Nider, Joel and Ladelsky, Razya and Gordon, Abel
Proceedings of the 9th ACM International on Systems and Storage Conference, pp. 23, 2016

Cross-ISA Container Migration
Nider, Joel and Rapoport, Mike
Proceedings of the 9th ACM International on Systems and Storage Conference, pp. 24, 2016


2015

High performance fault-tolerance for clouds
Kyriazis, Dimosthenis and Anagnostopoulos, Vasileios and Arcangeli, Andrea and Gilbert, David and Kalogeras, Dimitrios and Kat, Ronen and Klein, Cristian and Kokkinos, Panagiotis and Kuperman, Yossi and Nider, Joel and others
2015 IEEE Symposium on Computers and Communication (ISCC), pp. 251--257