Dany (D.) Minier  Dany (D.) Minier photo       

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Test Application Engineer
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2010

Low-cost 20 Gbps digital test signal synthesis using SiGe and InP Logic
David Keezer, Carl Gray, Dany Minier, Patrice Ducharme
Journal of Electronic Testing 26(1), 87--96, Springer, 2010


2009

A development platform and electronic modules for automated test up to 20 Gbps
David C Keezer, Carl Gray, A Majid, Dany Minier, Patrice Ducharme
Test Conference, 2009. ITC 2009. International, pp. 1--11


2008

MEMS switches and SiGe logic for multi-GHz loopback testing
David C Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop
VLSI Design 2008(3), 1, Hindawi Publishing Corp.

Variable delay of multi-gigahertz digital signals for deskew and jitter-injection test applications
David C Keezer, Dany Minier, Patrice Ducharme
Proceedings of the conference on Design, automation and test in Europe, pp. 1486--1491, 2008

An electronic module for 12.8 Gbps multiplexing and loopback test
David C Keezer, Dany Minier, Patrice Ducharme, A Majid
Test Conference, 2008. ITC 2008. IEEE International, pp. 1--9


2007

Multi-GHz loopback testing using MEMs switches and SiGe logic
David C Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, JS McKillop
Test Conference, 2007. ITC 2007. IEEE International, pp. 1--10

Method for reducing jitter in multi-gigahertz ATE
David C Keezer, Dany Minier, Patrice Ducharme
Proceedings of the conference on Design, automation and test in Europe, pp. 701--706, 2007


2006

Source-synchronous testing of multilane PCI Express and HyperTransport buses
David C Keezer, Dany Minier, Patrice Ducharme
Design & Test of Computers, IEEE 23(1), 46--57, IEEE, 2006


2004

Modular extension of ATE to 5 Gbps
David C Keezer, Dany Minier, M Paradis, F Binette
Test Conference, 2004. Proceedings. ITC 2004. International, pp. 748--757

Multiplexing ATE channels for production testing at 2.5 Gbps
David C Keezer, Dany Minier, Marie-Christine Caron
Design & Test of Computers, IEEE 21(4), 288--301, IEEE, 2004


2003

A production-oriented multiplexing system for testing above 2.5 Gbps
David C Keezer, Dany Minier, Marie-Christine Caron
null, pp. 191, 2003