Mark Lantz received B.Sc. (91) and M.Sc. (93) degrees in electrical engineering from the University of Alberta, Canada, and a Ph.D. from the University of Cambridge, U.K., in 1997 for work in the field of scanning probe microscopy and tribology. He then spent two years as a postdoctoral researcher at the Joint Research Center for Atom Technology in Japan, investigating the application of scanning probes in biophysics, followed by two years of research in the area of low temperature scanning force microscopy at the Physics Institute in the University of Basel, Switzerland.
In 2001, he joined the Micro/ Nanomechanics group of the IBM Zurich Research Laboratory as a Research Staff Member. Currently, Dr. Lantz is managing the Advanced Tape Technologies group in the Storage Dept of the IBM Zurich Research Laboratory.
His research interests include data storage technologies with an emphasis on magnetic recording and novel solid state memories, scanning probe technologies, mechatronics, nano-positioning, micro and nanomechanical devices, and nanotribology.