James H. (Jim) Stathis  James H. (Jim) Stathis photo       

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Electrical Characterization and Reliability
Thomas J. Watson Research Center, Yorktown Heights, NY USA
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Professional Associations

Professional Associations:  American Physical Society (APS)  |  IEEE Electron Devices Society (EDS)

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Manager, Electrical Characterization and Reliability

I serve as manager of a fantastic group of Researchers with deep expertise in electrical characterization of transistor gate dielectrics and transistor reliability, and dielectric breakdown in general, including BEOL dielectrics. My own expertise is in oxide breakdown and circuit reliability . Here's a recent short tutorial.


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