Michael R. Scheuermann, IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York, 10598 ( firstname.lastname@example.org ). Dr. Scheuermann received his Ph.D. degree in physics from Wayne State University in 1983. He then joined IBM studying electrical and optical properties of superconducting films. In 1985 he joined the VLSI Test and Measurement group where he worked on picosecond opto-electronics and developed a high bandwidth probe for testing high pin count integrated circuits. In 1995 he joined the VLSI Design group and was responsible the L2 integration on the POWER4 and POWER5 microprocessors. He then served as lead integrator for the POWER6 core. Subsequently he worked on the high level design for the Series P and BlueGeneQ microprocessors and has recently been exploring the use of 3D integration for high-performance systems. Dr. Scheuermann has co-author more than 45 technical articles, holds 11 US patents, and has received various awards at IBM including a Research Division Award, 8 Outstanding Technical Achievement Awards and 4 Invention Achievement Awards.