Yixin Diao  Yixin Diao photo       

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Research Staff Member, Member of IBM Academy of Technology
Thomas J. Watson Research Center, Yorktown Heights, NY USA
  +1dash914dash945dash2952

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Yixin Diao is a Research Staff Member at the IBM Thomas J. Watson Research Center. He received his Ph.D. degree in Electrical Engineering from Ohio State University in 2000. His research interests include feedback control of computing systems, complexity analysis of IT systems and processes, and modeling and optimization of service systems. He received IBM Outstanding Innovation Award in 2005, was named IBM Master Inventor in 2007, received IBM Outstanding Technical Achievement Award in 2012, won IBM Extraordinary Research Accomplishment in 2013, was appointed to IBM Academy of Technology in 2014, and received IBM Major Outstanding Technical Achievement Award in 2015.

Dr. Diao has published more than eighty papers and filed more than thirty patents. He is the co-author of the book "Feedback Control of Computing Systems" (Wiley 2004) and the co-editor of the book "Maximizing Management Performance and Quality with Service Analytics" (IGI Global 2015). He is the recipient of the 2002 Best Paper Award at IEEE/IFIP Network Operations and Management Symposium, the 2002-2005 Theory Paper Prize from the International Federation of Automatic Control, the 2008 Best Paper Award at IEEE International Conference on Services Computing, the Second Place of the 2012 Innovation in Analytics Award from Institute for Operations Research and the Management Sciences, and the 2014 Best Paper Award at IEEE/IFIP Network Operations and Management Symposium. He served as Program Co-chair for the International Conference on Network and Service Management in 2010, the IFIP/IEEE International Symposium on Integrated Network Management in 2013, and the IEEE International Conference on Cloud and Autonomic Computing in 2016. He is an Associate Editor of IEEE Transactions on Network and Service Management, and Journal of Network and Systems Management. He is a Fellow of IEEE.